Role of thickness on the optical and electrical properties of physically evaporated TiO2 thin films and silicon-based n-TiO2/p-Si heterojunction (HJ) configurations

ÖZMENTEŞ REŞİT

Role of thickness on the optical and electrical properties of physically evaporated TiO2 thin films and silicon-based n-TiO2/p-Si heterojunction (HJ) configurations

YAYIN ID:

9603497

KAPSAM AD:

Uluslararası

HAKEM TUR AD:

Hakemli

ENDEKS:

SCI-Expanded

MAKALE ADI:

Role of thickness on the optical and electrical properties of physically evaporated TiO2 thin films and silicon-based n-TiO2/p-Si heterojunction (HJ) configurations

YAZAR ADI:

ÖZMENTEŞ REŞİT

DERGI ADI:

Journal of Materials Science: Materials in Electronics

YAYIN DILI ADI:

İngilizce

AY:

YIL:

2025

CILT:

SAYI:

1039

ILK SAYFA:

SON SAYFA:

ISSN:

0957-4522

ERISIM TURU AD:

Elektronik

ALAN BILGISI:

Fen Bilimleri ve Matematik Temel Alanı>Fizik>Yoğun Madde Fiziği>Optoelektronik>Yarı İletkenler>Heteroeklem,İnce film

YAZAR ID:

8678217

GUNCELLEME TARIHI:

2025-07-08 11:46:01

MAKALE TURU AD:

Özgün Makale

ERISIM LINKI:

https://link.springer.com/article/10.1007/s10854-025-15153-8